Blar i AURA på forfatter "Rueda, Luis"
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A new paradigm for pattern classification: Nearest Border Techniques
Li, Yifeng; Oommen, B. John; Ngom, Alioune; Rueda, Luis (Lecture Notes in Computer Science;8272, Chapter; Peer reviewed, 2013)There are many paradigms for pattern classification. As opposed to these, this paper introduces a paradigm that has not been reported in the literature earlier, which we shall refer to as the Nearest Border (NB) paradigm. ... -
Multi-class pairwise linear dimensionality reduction using heteroscedastic schemes
Rueda, Luis; Oommen, B. John; Henríquez, Claudio (Peer reviewed; Journal article, 2010)Linear dimensionality reduction (LDR) techniques have been increasingly important in pattern recognition (PR) due to the fact that they permit a relatively simple mapping of the problem onto a lower-dimensional subspace, ... -
Pattern classification using a new border identification paradigm: The nearest border technique
Li, Yifeng; Oommen, John; Ngom, Alioune; Rueda, Luis (Journal article; Peer reviewed, 2015)